Sub-𝜇⁢m axial precision depth imaging with entangled two-color Hong-Ou-Mandel microscopy

Cyril C Torre; Alex R McMillan; Jorge A Monroy Ruz; Jonathan C F Matthews

doi:10.1103/PhysRevA.108.023726

Sub-𝜇⁢m axial precision depth imaging with entangled two-color Hong-Ou-Mandel microscopy

Cyril C Torre, Alex R McMillan, Jorge A Monroy Ruz, Jonathan C F Matthews

Research output: Contribution to journal › Article (Academic Journal) › peer-review

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Abstract

The quantum interference of two wavelength-entangled photons overlapping at a beamsplitter results in an oscillating interference pattern. The frequency of the beat note is dependent on the wavelength separation of the entangled photons but is robust to wavelength scale perturbations that can limit the practicality of standard interferometry. Here we use two-color entanglement interferometry to evaluate the variation in thickness of a semi-transparent sample in combination with two-dimensional raster scanning. The axial precision and the dynamic range of the microscope are actively controlled by adjusting the wavelength separation of the entangled photon pairs. Sub-𝜇⁢m precision is reported using up to 12.3nm of detuning and ∼104 detected photon pairs.

Original language	English
Article number	023726
Number of pages	7
Journal	Physical Review A
Volume	108
Early online date	24 Aug 2023
DOIs	https://doi.org/10.1103/PhysRevA.108.023726
Publication status	Published - Aug 2023

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@article{fdf6715aa06245db90af96b63f0b4f8b,

title = "Sub-𝜇⁢m axial precision depth imaging with entangled two-color Hong-Ou-Mandel microscopy",

abstract = "The quantum interference of two wavelength-entangled photons overlapping at a beamsplitter results in an oscillating interference pattern. The frequency of the beat note is dependent on the wavelength separation of the entangled photons but is robust to wavelength scale perturbations that can limit the practicality of standard interferometry. Here we use two-color entanglement interferometry to evaluate the variation in thickness of a semi-transparent sample in combination with two-dimensional raster scanning. The axial precision and the dynamic range of the microscope are actively controlled by adjusting the wavelength separation of the entangled photon pairs. Sub-𝜇⁢m precision is reported using up to 12.3nm of detuning and ∼104 detected photon pairs.",

author = "Torre, {Cyril C} and McMillan, {Alex R} and {Monroy Ruz}, {Jorge A} and Matthews, {Jonathan C F}",

year = "2023",

month = aug,

doi = "10.1103/PhysRevA.108.023726",

language = "English",

volume = "108",

journal = "Physical Review A",

issn = "2469-9926",

publisher = "American Physical Society (APS)",

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T1 - Sub-𝜇⁢m axial precision depth imaging with entangled two-color Hong-Ou-Mandel microscopy

AU - Torre, Cyril C

AU - McMillan, Alex R

AU - Monroy Ruz, Jorge A

AU - Matthews, Jonathan C F

PY - 2023/8

Y1 - 2023/8

N2 - The quantum interference of two wavelength-entangled photons overlapping at a beamsplitter results in an oscillating interference pattern. The frequency of the beat note is dependent on the wavelength separation of the entangled photons but is robust to wavelength scale perturbations that can limit the practicality of standard interferometry. Here we use two-color entanglement interferometry to evaluate the variation in thickness of a semi-transparent sample in combination with two-dimensional raster scanning. The axial precision and the dynamic range of the microscope are actively controlled by adjusting the wavelength separation of the entangled photon pairs. Sub-𝜇⁢m precision is reported using up to 12.3nm of detuning and ∼104 detected photon pairs.

AB - The quantum interference of two wavelength-entangled photons overlapping at a beamsplitter results in an oscillating interference pattern. The frequency of the beat note is dependent on the wavelength separation of the entangled photons but is robust to wavelength scale perturbations that can limit the practicality of standard interferometry. Here we use two-color entanglement interferometry to evaluate the variation in thickness of a semi-transparent sample in combination with two-dimensional raster scanning. The axial precision and the dynamic range of the microscope are actively controlled by adjusting the wavelength separation of the entangled photon pairs. Sub-𝜇⁢m precision is reported using up to 12.3nm of detuning and ∼104 detected photon pairs.

U2 - 10.1103/PhysRevA.108.023726

DO - 10.1103/PhysRevA.108.023726

M3 - Article (Academic Journal)

SN - 2469-9926

VL - 108

JO - Physical Review A

JF - Physical Review A

M1 - 023726

ER -

Sub-𝜇⁢m axial precision depth imaging with entangled two-color Hong-Ou-Mandel microscopy

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