Suspended membrane GaN gratings for refractive index sensing

Yongjin Wang; Jiajia Chen; Zheng Shi; Shumin He; Martin Lopez Garcia; Lifeng Chen; Nikolai A. Hueting; Martin Cryan; Miao Zhang; Hongbo Zhu

doi:10.7567/APEX.7.052201

Suspended membrane GaN gratings for refractive index sensing

Yongjin Wang^*, Jiajia Chen, Zheng Shi, Shumin He, Martin Lopez Garcia, Lifeng Chen, Nikolai A. Hueting, Martin Cryan, Miao Zhang, Hongbo Zhu

^*Corresponding author for this work

Research output: Contribution to journal › Article (Academic Journal)

16 Citations (Scopus)

Abstract

In this paper, we describe the fabrication and the novel procedure for back thinning the GaN layer, which leads to improved optical performance. Angular-resolved reflectance measurements are then conducted to characterize the GaN gratings and show the dependence of resonant wavelength on grating period and membrane thickness. The measured results compare well with electromagnetic modeling based on rigorous coupled wave analysis (RCWA). Altering the dielectric environment has been shown as a novel sensing mechanism, and this work opens the way to the fabrication of novel GaN resonant photonic devices for refractive index sensing applications in the visible wavelength range. (C) 2014 The Japan Society of Applied Physics

Original language	English
Article number	052201
Number of pages	4
Journal	Applied Physics Express
Volume	7
Issue number	5
DOIs	https://doi.org/10.7567/APEX.7.052201
Publication status	Published - May 2014

Access to Document

10.7567/APEX.7.052201

Projects

1 Finished

INTEGRATED LASER INDUCED FLUORESCENCE SYSTEM USING PHOTONIC CRYSTAL CAVITIES

Cryan, M. J.

1/04/09 → 1/04/12

Project: Research

Cite this

Wang, Y., Chen, J., Shi, Z., He, S., Garcia, M. L., Chen, L., Hueting, N. A., Cryan, M., Zhang, M., & Zhu, H. (2014). Suspended membrane GaN gratings for refractive index sensing. Applied Physics Express, 7(5), [052201]. https://doi.org/10.7567/APEX.7.052201

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abstract = "In this paper, we describe the fabrication and the novel procedure for back thinning the GaN layer, which leads to improved optical performance. Angular-resolved reflectance measurements are then conducted to characterize the GaN gratings and show the dependence of resonant wavelength on grating period and membrane thickness. The measured results compare well with electromagnetic modeling based on rigorous coupled wave analysis (RCWA). Altering the dielectric environment has been shown as a novel sensing mechanism, and this work opens the way to the fabrication of novel GaN resonant photonic devices for refractive index sensing applications in the visible wavelength range. (C) 2014 The Japan Society of Applied Physics",

author = "Yongjin Wang and Jiajia Chen and Zheng Shi and Shumin He and Garcia, {Martin Lopez} and Lifeng Chen and Hueting, {Nikolai A.} and Martin Cryan and Miao Zhang and Hongbo Zhu",

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AU - Wang, Yongjin

AU - Chen, Jiajia

AU - Shi, Zheng

AU - He, Shumin

AU - Garcia, Martin Lopez

AU - Chen, Lifeng

AU - Hueting, Nikolai A.

AU - Cryan, Martin

AU - Zhang, Miao

AU - Zhu, Hongbo

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AB - In this paper, we describe the fabrication and the novel procedure for back thinning the GaN layer, which leads to improved optical performance. Angular-resolved reflectance measurements are then conducted to characterize the GaN gratings and show the dependence of resonant wavelength on grating period and membrane thickness. The measured results compare well with electromagnetic modeling based on rigorous coupled wave analysis (RCWA). Altering the dielectric environment has been shown as a novel sensing mechanism, and this work opens the way to the fabrication of novel GaN resonant photonic devices for refractive index sensing applications in the visible wavelength range. (C) 2014 The Japan Society of Applied Physics

U2 - 10.7567/APEX.7.052201

DO - 10.7567/APEX.7.052201

M3 - Article (Academic Journal)

VL - 7

JO - Applied Physics Express

JF - Applied Physics Express

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