Synchrotron investigations of non-uniformly shaped shot-peened samples

A.M. Venter, C.P. La Grange, F. Hofmann, T.-S. Jun, J. Belnoue, P.R. Van Heerden, A. Evans, A.M. Korsunsky

Research output: Contribution to journalArticle (Academic Journal)peer-review

1 Citation (Scopus)


We report results from X-ray synchrotron residual strain investigations of conically shaped 17-4PH stainless steel samples treated to different shot-peen intensities. The residual strains are compared to the as-manufactured condition as well as a sample cold-water quenched. The magnitudes of the induced residual strains in the shot-peened samples are in relation to the peen intensities. Investigations on slices cut from the bulk samples indicate a underlying material thickness dependence.

Original languageEnglish
Pages (from-to)315-320
Number of pages6
JournalZeitschrift für Kristallographie
Publication statusPublished - 2009


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