Synchrotron X-ray reticulographic measurement of lattice deformations associated with energetic ion implantation in diamond

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Translated title of the contribution	Synchrotron X-ray reticulographic measurement of lattice deformations associated with energetic ion implantation in diamond
Original language	English
Pages (from-to)	1119 - 1126
Journal	Journal of Applied Crystallography
Volume	32
Publication status	Published - 1999

Publisher: International Union of Crystallography

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@article{f28fa1ff21544d65adca2412be7bdf1f,

title = "Synchrotron X-ray reticulographic measurement of lattice deformations associated with energetic ion implantation in diamond",

author = "AR Lang and APW Makepeace",

note = "Publisher: International Union of Crystallography",

year = "1999",

language = "English",

volume = "32",

pages = "1119 -- 1126",

journal = "Journal of Applied Crystallography",

issn = "1600-5767",

publisher = "International Union of Crystallography",

}

TY - JOUR

T1 - Synchrotron X-ray reticulographic measurement of lattice deformations associated with energetic ion implantation in diamond

AU - Lang, AR

AU - Makepeace, APW

N1 - Publisher: International Union of Crystallography

PY - 1999

Y1 - 1999

M3 - Article (Academic Journal)

SN - 1600-5767

VL - 32

SP - 1119

EP - 1126

JO - Journal of Applied Crystallography

JF - Journal of Applied Crystallography

ER -