Synchrotron X-ray reticulography: a versatile new technique for mapping misorientations in single crystals

AR Lang, APW Makepeace

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

Translated title of the contribution	Synchrotron X-ray reticulography: a versatile new technique for mapping misorientations in single crystals
Original language	English
Title of host publication	Unknown
Pages	457 - 460
Volume	157
Publication status	Published - 1997

Conference Proceedings/Title of Journal: Microscopy of Semiconducting Materials 1997

Handle.net

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title = "Synchrotron X-ray reticulography: a versatile new technique for mapping misorientations in single crystals",

author = "AR Lang and APW Makepeace",

note = "Conference Proceedings/Title of Journal: Microscopy of Semiconducting Materials 1997",

year = "1997",

language = "English",

isbn = "075034642",

volume = "157",

pages = "457 -- 460",

booktitle = "Unknown",

}

TY - GEN

T1 - Synchrotron X-ray reticulography: a versatile new technique for mapping misorientations in single crystals

AU - Lang, AR

AU - Makepeace, APW

N1 - Conference Proceedings/Title of Journal: Microscopy of Semiconducting Materials 1997

PY - 1997

Y1 - 1997

M3 - Conference Contribution (Conference Proceeding)

SN - 075034642

VL - 157

SP - 457

EP - 460

BT - Unknown

ER -