Tau-P domain VTI parameter inversions using limited-offset data

J Wookey, M Van der Baan, D Smit, J-M Kendall

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

Abstract

F041
Translated title of the contributionTau-P domain VTI parameter inversions using limited-offset data
Original languageEnglish
Title of host publication64th EAGE conference & technical exhibition, Florence, Italy 2002
Publication statusPublished - 2002

Bibliographical note

Conference Organiser: EAGE

Cite this