TEM characterisation of defects, strains and local electric fields in AlGaN/InGaN/GaN structures

D Cherns

Research output: Contribution to journalArticle (Academic Journal)peer-review

2 Citations (Scopus)
Translated title of the contributionTEM characterisation of defects, strains and local electric fields in AlGaN/InGaN/GaN structures
Original languageEnglish
Pages (from-to)274 - 279
Number of pages6
JournalMaterials Science and Engineering: B
Volume91
Publication statusPublished - 2002

Bibliographical note

Publisher: Elsevier Science SA, Lausanne
Other: Special Issue, Invited Review

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