TEM, CL and electron holography of dislocations in GaN

D Cherns

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

Translated title of the contribution	TEM, CL and electron holography of dislocations in GaN
Original language	English
Title of host publication	Int. Congress on Electron Microscopy ICEM15, Durban, South Africa, September 2002
Editors	J. Englebrecht, Mr. Witcomb
Publisher	Microscopy Soc. of South Africa
Pages	27 - 28
Volume	1
Publication status	Published - 2002

Conference Proceedings/Title of Journal: Proc. of ICEM15
Conference Organiser: Microscopy Soc. of South Africa

Handle.net

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title = "TEM, CL and electron holography of dislocations in GaN",

author = "D Cherns",

note = "Conference Proceedings/Title of Journal: Proc. of ICEM15 Conference Organiser: Microscopy Soc. of South Africa",

year = "2002",

language = "English",

volume = "1",

pages = "27 -- 28",

editor = "J. Englebrecht and Mr. Witcomb",

booktitle = "Int. Congress on Electron Microscopy ICEM15, Durban, South Africa, September 2002",

publisher = "Microscopy Soc. of South Africa",

}

TY - GEN

T1 - TEM, CL and electron holography of dislocations in GaN

AU - Cherns, D

N1 - Conference Proceedings/Title of Journal: Proc. of ICEM15 Conference Organiser: Microscopy Soc. of South Africa

PY - 2002

Y1 - 2002

M3 - Conference Contribution (Conference Proceeding)

VL - 1

SP - 27

EP - 28

BT - Int. Congress on Electron Microscopy ICEM15, Durban, South Africa, September 2002

A2 - Englebrecht, J.

A2 - Witcomb, Mr.

PB - Microscopy Soc. of South Africa

ER -