Abstract
Functional verification is a complex and time-consuming task in the design process. Recently, various approaches have been developed to improve verification efficiency, including advanced coverage analysis techniques, coverage-driven verification methodologies and coverage-directed stimulus generation techniques. One remaining challenge is to fully automate functional coverage closure. This paper presents a novel approach for coverage-directed stimulus generation based on inductive learning from examples. Test sequences and their related coverage are examined to induce general rules which describe the characteristics ofthese tests. Coverage closure can be automated by applying the rule learning to clusters similar to the target coverage hole and combining the resulting rules to obtain directives for test generation. The validity of the approach is demonstrated on a pilot case study.
Translated title of the contribution | Test Directive Generation for Functional Coverage Closure Using Inductive Logic Programming |
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Original language | English |
Title of host publication | 11th Annual IEEE International High Level Design Validation and Test Workshop, Monterey, California, November 2006 |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Pages | 11 - 18 |
Number of pages | 8 |
ISBN (Print) | 1424406803 |
DOIs | |
Publication status | Published - Nov 2006 |
Bibliographical note
Other page information: -Conference Proceedings/Title of Journal: IEEE International High Level Design Validation and Test Workshop (HLDVT) 2006
Other identifier: 2000611