Test Directive Generation for Functional Coverage Closure Using Inductive Logic Programming

H-W Hsueh, KI Eder

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

12 Citations (Scopus)

Abstract

Functional verification is a complex and time-consuming task in the design process. Recently, various approaches have been developed to improve verification efficiency, including advanced coverage analysis techniques, coverage-driven verification methodologies and coverage-directed stimulus generation techniques. One remaining challenge is to fully automate functional coverage closure. This paper presents a novel approach for coverage-directed stimulus generation based on inductive learning from examples. Test sequences and their related coverage are examined to induce general rules which describe the characteristics ofthese tests. Coverage closure can be automated by applying the rule learning to clusters similar to the target coverage hole and combining the resulting rules to obtain directives for test generation. The validity of the approach is demonstrated on a pilot case study.
Translated title of the contributionTest Directive Generation for Functional Coverage Closure Using Inductive Logic Programming
Original languageEnglish
Title of host publication11th Annual IEEE International High Level Design Validation and Test Workshop, Monterey, California, November 2006
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages11 - 18
Number of pages8
ISBN (Print)1424406803
DOIs
Publication statusPublished - Nov 2006

Bibliographical note

Other page information: -
Conference Proceedings/Title of Journal: IEEE International High Level Design Validation and Test Workshop (HLDVT) 2006
Other identifier: 2000611

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