The Effect of Gaseous and Liquid Water Layer on Estimation of Composition of Materials in High Pressure Scanning Electron Microscopy (HPSEM):  A Monte Carlo Simulation.  In "Electron Microscopy and Analysis

R Powell; KJ Hollis; JS Shah

The Effect of Gaseous and Liquid Water Layer on Estimation of Composition of Materials in High Pressure Scanning Electron Microscopy (HPSEM): A Monte Carlo Simulation. In "Electron Microscopy and Analysis

R Powell
, KJ Hollis
, JS Shah

School of Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

Translated title of the contribution	The Effect of Gaseous and Liquid Water Layer on Estimation of Composition of Materials in High Pressure Scanning Electron Microscopy (HPSEM): A Monte Carlo Simulation. In "Electron Microscopy and Analysis
Original language	English
Title of host publication	Inst.Phys.Conf.Ser
Publisher	IOP Publishing
Pages	245 - 248
Volume	153
Publication status	Published - 1997

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@inproceedings{ff2368c706014f249b31f5a0fda9e80f,

title = "The Effect of Gaseous and Liquid Water Layer on Estimation of Composition of Materials in High Pressure Scanning Electron Microscopy (HPSEM): A Monte Carlo Simulation. In {"}Electron Microscopy and Analysis",

author = "R Powell and KJ Hollis and JS Shah",

year = "1997",

language = "English",

volume = "153",

pages = "245 -- 248",

booktitle = "Inst.Phys.Conf.Ser",

publisher = "IOP Publishing",

address = "United Kingdom",

}

The Effect of Gaseous and Liquid Water Layer on Estimation of Composition of Materials in High Pressure Scanning Electron Microscopy (HPSEM): A Monte Carlo Simulation. In "Electron Microscopy and Analysis. / Powell, R; Hollis, KJ; Shah, JS.
Inst.Phys.Conf.Ser. Vol. 153 IOP Publishing, 1997. p. 245 - 248.

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

TY - GEN

T1 - The Effect of Gaseous and Liquid Water Layer on Estimation of Composition of Materials in High Pressure Scanning Electron Microscopy (HPSEM): A Monte Carlo Simulation. In "Electron Microscopy and Analysis

AU - Powell, R

AU - Hollis, KJ

AU - Shah, JS

PY - 1997

Y1 - 1997

M3 - Conference Contribution (Conference Proceeding)

VL - 153

SP - 245

EP - 248

BT - Inst.Phys.Conf.Ser

PB - IOP Publishing

ER -