The Effect of Stacking Sequence on Thickness Scaling of Tests on Open Hole Tensile Composite Specimens

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

5 Citations (Scopus)

Translated title of the contribution	The Effect of Stacking Sequence on Thickness Scaling of Tests on Open Hole Tensile Composite Specimens
Original language	English
Title of host publication	48th AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference, Honolulu, USA
Publisher	American Institute of Aeronautics and Astronautics Inc. (AIAA)
Number of pages	10
Publication status	Published - Apr 2007

Conference Organiser: AIAA

Handle.net

@inproceedings{d714a769156f4d3f827bc250b2dd0344,

title = "The Effect of Stacking Sequence on Thickness Scaling of Tests on Open Hole Tensile Composite Specimens",

author = "SR Hallett and WG Jiang and MR Wisnom",

note = "Conference Organiser: AIAA",

year = "2007",

month = apr,

language = "English",

booktitle = "48th AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference, Honolulu, USA",

publisher = "American Institute of Aeronautics and Astronautics Inc. (AIAA)",

address = "United States",

}

The Effect of Stacking Sequence on Thickness Scaling of Tests on Open Hole Tensile Composite Specimens. / Hallett, SR; Jiang, WG; Wisnom, MR.
48th AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference, Honolulu, USA. American Institute of Aeronautics and Astronautics Inc. (AIAA), 2007.

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

TY - GEN

T1 - The Effect of Stacking Sequence on Thickness Scaling of Tests on Open Hole Tensile Composite Specimens

AU - Hallett, SR

AU - Jiang, WG

AU - Wisnom, MR

N1 - Conference Organiser: AIAA

PY - 2007/4

Y1 - 2007/4

M3 - Conference Contribution (Conference Proceeding)

BT - 48th AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics, and Materials Conference, Honolulu, USA

PB - American Institute of Aeronautics and Astronautics Inc. (AIAA)

ER -