The impact of baseband electrical memory effects on the dynamic transfer characteristics of microwave power transistors

M Akmal, J Lees, S Ben Smida, S Woodington, J Benedikt, KA Morris, MA Beach, JP McGeehan, P Tasker

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

18 Citations (Scopus)
428 Downloads (Pure)

Abstract

The inter-modulation distortion products can vary both in terms of amplitude and asymmetry due to the effects of baseband and 2nd harmonic impedance. This paper presents an investigation into the relationship between the IMD asymmetries caused by baseband impedance variation and the looping or hysteresis that can sometimes appear in the dynamic transfer characteristics of microwave power devices when subjected to modulated excitation. The investigation is carried out using a 2W GaN HFET bare die device characterized at 2.1GHz, and using IF active load-pull to clarify the role of baseband impedance on observed hysteresis in the dynamic transfer characteristics. Analysis is performed using the envelope domain in order to more effectively reveal the DUT's sensitivity to impedance environments and specifically electrical baseband memory effects.
Translated title of the contributionThe impact of baseband electrical memory effects on the dynamic transfer characteristics of microwave power transistors
Original languageEnglish
Title of host publicationWorkshop on Integrated Nonlinear Microwave and Millimeter-Wave Circuits 2010 (INMMIC) Gothenberg, Sweden
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages148 - 151
Number of pages4
ISBN (Print)9781424474103
DOIs
Publication statusPublished - Apr 2010
EventWorkshop on Integrated Nonlinear Microwave and Millimeter-Wave Circuits - Goteborg, Sweden
Duration: 1 Apr 2010 → …

Workshop

WorkshopWorkshop on Integrated Nonlinear Microwave and Millimeter-Wave Circuits
CountrySweden
CityGoteborg
Period1/04/10 → …

Bibliographical note

Rose publication type: Conference contribution

Sponsorship: This work has been carried out as part of EPSRC grant EP/F033702/1. The authors would also like to thank CREE for supporting this activity and supplying the devices; specifically Ray Pengelly and Mr. Simon Wood.

Terms of use: Copyright © 2010 IEEE. Reprinted from Workshop on Integrated Nonlinear Microwave and Millimeter-Wave Circuits (INMMIC), 2010.

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Keywords

  • envelope domain
  • hysteresis
  • GaN
  • IF active load pull
  • inter-modulation
  • memory effects

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    Akmal, M., Lees, J., Ben Smida, S., Woodington, S., Benedikt, J., Morris, KA., Beach, MA., McGeehan, JP., & Tasker, P. (2010). The impact of baseband electrical memory effects on the dynamic transfer characteristics of microwave power transistors. In Workshop on Integrated Nonlinear Microwave and Millimeter-Wave Circuits 2010 (INMMIC) Gothenberg, Sweden (pp. 148 - 151). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/INMMIC.2010.5480111