The impact of Ti/Al contacts on AlGaN/GaN HEMT vertical leakage and breakdown

Ben Rackauskas, Michael J. Uren, Steve Stoffels, Ming Zhao, Benoit Bakeroot, Stefaan Decoutere, Martin Kuball

Research output: Contribution to journalArticle (Academic Journal)peer-review

7 Citations (Scopus)
370 Downloads (Pure)

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