The interpretation of simultaneous small and wide-angle X-ray scattering data collected during quiescent crystallisation

Research output: Contribution to journalArticle (Academic Journal)

Abstract

Small and wide-angle X-ray scattering patterns have been calculated from randomly oriented stacks of lamellar crystals of isotactic polypropylene, at various stages during a hypothetical growth process. When the crystals have a small lateral width, it is possible to detect a long-period peak in the small-angle pattern when the crystalline wide-angle trace is too weak to be detected above the background noise. This finding has important implications for the interpretation of simultaneous small and wide-angle X-ray data collected during quiescent crystallization experiments. In particular, it challenges the suggestion that such measurements provide evidence for crystal growth through spinodal decomposition.
Translated title of the contributionThe interpretation of simultaneous small and wide-angle X-ray scattering data collected during quiescent crystallisation
Original languageEnglish
Pages (from-to)31 - 37
Number of pages7
JournalFibre Diffraction Review
Volume13
DOIs
Publication statusPublished - Apr 2005

Bibliographical note

Publisher: Collaborative Computational Project for Fibre Diffraction and Solution Scattering CCP13

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