The role of crystal orientation in the dissolution of UO2 thin films

S. Rennie*, E. Lawrence Bright, J. E. Sutcliffe, J. E. Darnbrough, Robert W Burrows, J. Rawle, C. Nicklin, G. H. Lander, R. Springell

*Corresponding author for this work

Research output: Contribution to journalArticle (Academic Journal)peer-review

4 Citations (Scopus)

Abstract

Single crystal [0 0 1], [1 1 0], and [1 1 1]-oriented UO2 thin films were utilised to investigate the orientational dependence of radiolytic dissolution. The films were exposed to water in the presence of a synchrotron X-ray source to induce dissolution, with X-ray reflectivity (XRR) used to observe changes in morphology as a function of exposure time. The [0 0 1] and [1 1 0]-oriented films were found to corrode at comparable rates, however, the [1 1 1] film was significantly more corrosion resistant, passivating after the initial 90 s dissolution period. This result shows the orientational dependence of UO2 dissolution, which may have important consequences for theoretical dissolution models.

Original languageEnglish
Pages (from-to)162-169
Number of pages8
JournalCorrosion Science
Volume145
Early online date26 Sep 2018
DOIs
Publication statusPublished - 1 Dec 2018

Keywords

  • Radiolytic dissolution
  • Sputtered films
  • Uranium dioxide
  • X-ray diffraction
  • X-ray reflectivity

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