Abstract
Single crystal [0 0 1], [1 1 0], and [1 1 1]-oriented UO2 thin films were utilised to investigate the orientational dependence of radiolytic dissolution. The films were exposed to water in the presence of a synchrotron X-ray source to induce dissolution, with X-ray reflectivity (XRR) used to observe changes in morphology as a function of exposure time. The [0 0 1] and [1 1 0]-oriented films were found to corrode at comparable rates, however, the [1 1 1] film was significantly more corrosion resistant, passivating after the initial 90 s dissolution period. This result shows the orientational dependence of UO2 dissolution, which may have important consequences for theoretical dissolution models.
Original language | English |
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Pages (from-to) | 162-169 |
Number of pages | 8 |
Journal | Corrosion Science |
Volume | 145 |
Early online date | 26 Sept 2018 |
DOIs | |
Publication status | Published - 1 Dec 2018 |
Keywords
- Radiolytic dissolution
- Sputtered films
- Uranium dioxide
- X-ray diffraction
- X-ray reflectivity
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Dr Ross S Springell
- School of Physics - Associate Professor in Actinide Physics and Nuclear Materials
- Cabot Institute for the Environment
Person: Academic , Member