Abstract
A memristor is often identified by showing its distinctive pinched hysteresis curve and testing for the effect of frequency. The hysteresis size should relate to frequency and shrink to zero as the frequency approaches infinity. Although mathematically understood, the material causes for this are not well known. The d.c. response of the memristor is a decaying curve with its own timescale. We show via mathematical reasoning that this decaying curve when transformed to a.c. leads to the frequency effect by considering a descretized curve. We then demonstrate the validity of this approach with experimental data from two different types of memristors.
Original language | English |
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Title of host publication | 2014 IEEE International Symposium on Circuits and Systems (ISCAS 2014) |
Subtitle of host publication | Proceedings of a meeting held 1-5 June 2014, Melbourne, Australia |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Pages | 2812-2815 |
Number of pages | 4 |
ISBN (Electronic) | 9781479934324 |
ISBN (Print) | 9781479934331 |
DOIs | |
Publication status | Published - Aug 2014 |
Event | 2014 IEEE International Symposium on Circuits and Systems, ISCAS 2014 - Melbourne, VIC, Australia Duration: 1 Jun 2014 → 5 Jun 2014 |
Conference
Conference | 2014 IEEE International Symposium on Circuits and Systems, ISCAS 2014 |
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Country/Territory | Australia |
City | Melbourne, VIC |
Period | 1/06/14 → 5/06/14 |