The use of electron holography for composition profiling of semiconductor heterostructure

PA Midgley, JS Barnard, D Cherns

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

Translated title of the contribution	The use of electron holography for composition profiling of semiconductor heterostructure
Original language	English
Title of host publication	Unknown
Pages	75 - 78
Volume	157
Publication status	Published - 1997

Conference Proceedings/Title of Journal: Proc. of Microscopy of Semiconducting Materials 1997, IOP Conf. Ser

Handle.net

@inproceedings{ee840a4efd7b492aa94fe70d556aa78d,

title = "The use of electron holography for composition profiling of semiconductor heterostructure",

author = "PA Midgley and JS Barnard and D Cherns",

note = "Conference Proceedings/Title of Journal: Proc. of Microscopy of Semiconducting Materials 1997, IOP Conf. Ser",

year = "1997",

language = "English",

volume = "157",

pages = "75 -- 78",

booktitle = "Unknown",

}

TY - GEN

T1 - The use of electron holography for composition profiling of semiconductor heterostructure

AU - Midgley, PA

AU - Barnard, JS

AU - Cherns, D

N1 - Conference Proceedings/Title of Journal: Proc. of Microscopy of Semiconducting Materials 1997, IOP Conf. Ser

PY - 1997

Y1 - 1997

M3 - Conference Contribution (Conference Proceeding)

VL - 157

SP - 75

EP - 78

BT - Unknown

ER -