| Translated title of the contribution | The use of focused ion beams for the characterisation of industrial mineral microparticles |
|---|---|
| Original language | English |
| Pages (from-to) | 72 - 77 |
| Number of pages | 6 |
| Journal | Applied Clay Science |
| Volume | 39 |
| DOIs | |
| Publication status | Published - Apr 2008 |
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