Thermal management and device failure assessment of high-power AlGaN/GaN HFETs

M Kuball, S Rajasingam, A Sarua, JM Hayes, MJ Uren, T Martin, RS Balmer, BT Hughes, K Hilton

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

2 Citations (Scopus)

Translated title of the contribution	Thermal management and device failure assessment of high-power AlGaN/GaN HFETs
Original language	English
Title of host publication	60th Device Research Conference, Santa Barbara 2002 in Device Research Conference Digest
Pages	99 - 100
Publication status	Published - 2002

Conference Organiser: IEEE Electron Devices Society

Structured keywords

@inproceedings{cdbddbe9745e4e7eb44dbac971b27dcf,

title = "Thermal management and device failure assessment of high-power AlGaN/GaN HFETs",

author = "M Kuball and S Rajasingam and A Sarua and JM Hayes and MJ Uren and T Martin and RS Balmer and BT Hughes and K Hilton",

note = "Conference Organiser: IEEE Electron Devices Society",

year = "2002",

language = "English",

pages = "99 -- 100",

booktitle = "60th Device Research Conference, Santa Barbara 2002 in Device Research Conference Digest",

}

TY - GEN

T1 - Thermal management and device failure assessment of high-power AlGaN/GaN HFETs

AU - Kuball, M

AU - Rajasingam, S

AU - Sarua, A

AU - Hayes, JM

AU - Uren, MJ

AU - Martin, T

AU - Balmer, RS

AU - Hughes, BT

AU - Hilton, K

N1 - Conference Organiser: IEEE Electron Devices Society

PY - 2002

Y1 - 2002

M3 - Conference Contribution (Conference Proceeding)

SP - 99

EP - 100

BT - 60th Device Research Conference, Santa Barbara 2002 in Device Research Conference Digest

ER -