Thermal mapping of defects in AlGaN/GaN heterostructure field-effect transistors using micro-Raman spectroscopy

JW Pomeroy, M Kuball, DJ Wallis, AM Keir, KP Hilton, RS Balmer, MJ Uren, T Martin, PJ Heard

Research output: Contribution to journalArticle (Academic Journal)peer-review

31 Citations (Scopus)
Translated title of the contributionThermal mapping of defects in AlGaN/GaN heterostructure field-effect transistors using micro-Raman spectroscopy
Original languageEnglish
Pages (from-to)103508-1 - 103508-3
Number of pages3
JournalApplied Physics Letters
Volume87(10)
DOIs
Publication statusPublished - Sep 2005

Bibliographical note

Publisher: American Institute of Physics

Structured keywords

  • CDTR

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