Thermal mapping of defects in AlGaN/GaN heterostructure field-effect transistors using micro-Raman spectroscopy

JW Pomeroy, M Kuball, DJ Wallis, AM Keir, KP Hilton, RS Balmer, MJ Uren, T Martin, PJ Heard

Research output: Contribution to journal › Article (Academic Journal) › peer-review

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THERMAL IMAGING OF ACTIVE A1GAN/GAN FIELD EFFECT TRANSISTORS USING MICRO RAMAN SPECTROSCOPY
Kuball, M. H. H. (Principal Investigator)
19/03/04 → 19/03/07
Project: Research