Thermal mapping of defects in AlGaN/GaN heterostructure field-effect transistors using micro-Raman spectroscopy

JW Pomeroy, M Kuball, DJ Wallis, AM Keir, KP Hilton, RS Balmer, MJ Uren, T Martin, PJ Heard

Research output: Contribution to journal › Article (Academic Journal) › peer-review

36 Citations (Scopus)

36 Citations
1 Other Conference Contribution

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2012

Novel Raman spectroscopy imaging in electronic devices: focus on device reliability
Sarua, A., Pomeroy, J. W., Uren, M. J. & Kuball, M. H. H., 24 Jan 2012.
Research output: Contribution to conference › Other Conference Contribution