Thermal properties and reliability of GaN microelectronics: Sub-micron spatial and nanosecond time resolution thermography

M Kuball, JW Pomeroy, RJ Simms, G Riedel, H Ji, A Sarua, MJ Uren, T Martin

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

14 Citations (Scopus)
Translated title of the contributionThermal properties and reliability of GaN microelectronics: Sub-micron spatial and nanosecond time resolution thermography
Original languageEnglish
Title of host publication4th IEEE Compound Semiconductor Integrated Circuit Symposium
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages135 - 138
Number of pages4
ISBN (Print)9781424410224
Publication statusPublished - 2007

Bibliographical note

Conference Proceedings/Title of Journal: IEEE Compound Semiconductor Integrated Circuit SYymposium - 2007 IEEE CSIC SYMPOSIUM, TECHNOLOGY DIGEST
Conference Organiser: IEEE

Structured keywords

  • CDTR

Cite this