Thickness dependence of the mobility at the LaAlO3/SrTiO3 interface

C. Bell*, S. Harashima, Y. Hikita, H. Y. Hwang, Chris Bell

*Corresponding author for this work

Research output: Contribution to journalArticle (Academic Journal)peer-review

85 Citations (Scopus)

Abstract

The electronic transport properties of a series of LaAlO3/SrTiO3 interfaces were investigated, and a systematic thickness dependence of the sheet resistance and magnetoresistance was found for constant growth conditions. This trend occurs above the critical thickness of four unit cells, below which the LaAlO3/SrTiO3 interface is not conducting. A dramatic decrease in mobility of the electron gas of nearly two orders of magnitude was observed with increasing LaAlO3 thickness from 5 to 25 unit cells.

Original languageEnglish
Article number222111
Number of pages3
JournalApplied Physics Letters
Volume94
Issue number22
DOIs
Publication statusPublished - 1 Jun 2009

Keywords

  • carrier mobility
  • electrical resistivity
  • electron gas
  • interface structure
  • lanthanum compounds
  • magnetoresistance
  • strontium compounds
  • OXIDES
  • STATE

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