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Dive into the research topics of 'Transfer IV and Threshold Voltage Drift of GaN and SiC Cascode Discrete Devices Under Gate Bias Stress'. Together they form a unique fingerprint.- Sort by
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Yasin Gunaydin*, Saeed Jahdi, Xibo Yuan, Bernard Stark, Jose Ortiz-Gonzalez, Erfan Bashar, Olayiwola Alatise, Phil Mellor
Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)