Transfer IV and Threshold Voltage Drift of GaN and SiC Cascode Discrete Devices Under Gate Bias Stress

Yasin Gunaydin*, Saeed Jahdi, Xibo Yuan, Bernard Stark, Jose Ortiz-Gonzalez, Erfan Bashar, Olayiwola Alatise, Phil Mellor

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

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