Transient thermoreflectance for device temperature assessment in pulsed-operated GaN-based HEMTs

Sara Martin Horcajo; James W Pomeroy; Benoit  Lambert; Helmut Jung; Hervé Blanck; Martin Kuball

Transient thermoreflectance for device temperature assessment in pulsed-operated GaN-based HEMTs

Sara Martin Horcajo, James W Pomeroy, Benoit Lambert, Helmut Jung, Hervé Blanck, Martin Kuball

School of Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

3 Citations (Scopus)

167 Downloads (Pure)

Abstract

Transient thermoreflectance measurements were demonstrated as a reliable technique for the thermal assessment of pulsed-operated HEMTs. Thermal modelling and time-resolved micro-Raman thermography were used for the determination of thermoreflectance coefficients of the metal contacts under study. The need of the extraction of the thermoreflectance coefficient value for each metal present at the device was demonstrated.

Original language	English
Title of host publication	CS MANTECH 2016
Subtitle of host publication	International Conference on Compound Semiconductor Manufacturing Technology
Publisher	CS Mantech
Pages	283-286
Number of pages	4
Publication status	Published - 17 May 2016
Event	31st Annual International Conference on Compound Semiconductor Manufacturing Technology, CS ManTech 2016 - Miami, United States Duration: 16 May 2016 → 19 May 2016

Conference

Conference	31st Annual International Conference on Compound Semiconductor Manufacturing Technology, CS ManTech 2016
Country/Territory	United States
City	Miami
Period	16/05/16 → 19/05/16

Structured keywords

CDTR

Keywords

HEMT
GaN
self-heating
transient thermoreflectance
time-resolved Raman
thermal modelling

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This is the author accepted manuscript (AAM). The final published version (version of record) is available online via CS MANTECH at http://csmantech2016.conferencespot.org/62266gmi-1.3079367/t016-1.3079795/f016-1.3079796/a067-1.3079797/an067-1.3091991. Please refer to any applicable terms of use of the publisher.
Accepted author manuscript, 446 KB

http://csmantech2016.conferencespot.org/62266gmi-1.3079367/t016-1.3079795/f016-1.3079796/a067-1.3079797/an067-1.3091991

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Martin Horcajo, S., Pomeroy, J. W., Lambert, B., Jung, H., Blanck, H., & Kuball, M. (2016). Transient thermoreflectance for device temperature assessment in pulsed-operated GaN-based HEMTs. In CS MANTECH 2016: International Conference on Compound Semiconductor Manufacturing Technology (pp. 283-286). CS Mantech. http://csmantech2016.conferencespot.org/62266gmi-1.3079367/t016-1.3079795/f016-1.3079796/a067-1.3079797/an067-1.3091991

@inproceedings{ae4366d255c54bbab4a5af50f904ccb2,

title = "Transient thermoreflectance for device temperature assessment in pulsed-operated GaN-based HEMTs",

abstract = "Transient thermoreflectance measurements were demonstrated as a reliable technique for the thermal assessment of pulsed-operated HEMTs. Thermal modelling and time-resolved micro-Raman thermography were used for the determination of thermoreflectance coefficients of the metal contacts under study. The need of the extraction of the thermoreflectance coefficient value for each metal present at the device was demonstrated.",

keywords = "HEMT, GaN, self-heating, transient thermoreflectance, time-resolved Raman, thermal modelling",

author = "{Martin Horcajo}, Sara and Pomeroy, {James W} and Benoit Lambert and Helmut Jung and Herv{\'e} Blanck and Martin Kuball",

year = "2016",

month = may,

day = "17",

language = "English",

pages = "283--286",

booktitle = "CS MANTECH 2016",

publisher = "CS Mantech",

note = "31st Annual International Conference on Compound Semiconductor Manufacturing Technology, CS ManTech 2016 ; Conference date: 16-05-2016 Through 19-05-2016",

}

Martin Horcajo, S, Pomeroy, JW, Lambert, B, Jung, H, Blanck, H & Kuball, M 2016, Transient thermoreflectance for device temperature assessment in pulsed-operated GaN-based HEMTs. in CS MANTECH 2016: International Conference on Compound Semiconductor Manufacturing Technology. CS Mantech, pp. 283-286, 31st Annual International Conference on Compound Semiconductor Manufacturing Technology, CS ManTech 2016, Miami, United States, 16/05/16. <http://csmantech2016.conferencespot.org/62266gmi-1.3079367/t016-1.3079795/f016-1.3079796/a067-1.3079797/an067-1.3091991>

Transient thermoreflectance for device temperature assessment in pulsed-operated GaN-based HEMTs. / Martin Horcajo, Sara; Pomeroy, James W; Lambert, Benoit et al.
CS MANTECH 2016: International Conference on Compound Semiconductor Manufacturing Technology. CS Mantech, 2016. p. 283-286.

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

TY - GEN

T1 - Transient thermoreflectance for device temperature assessment in pulsed-operated GaN-based HEMTs

AU - Martin Horcajo, Sara

AU - Pomeroy, James W

AU - Lambert, Benoit

AU - Jung, Helmut

AU - Blanck, Hervé

AU - Kuball, Martin

PY - 2016/5/17

Y1 - 2016/5/17

N2 - Transient thermoreflectance measurements were demonstrated as a reliable technique for the thermal assessment of pulsed-operated HEMTs. Thermal modelling and time-resolved micro-Raman thermography were used for the determination of thermoreflectance coefficients of the metal contacts under study. The need of the extraction of the thermoreflectance coefficient value for each metal present at the device was demonstrated.

AB - Transient thermoreflectance measurements were demonstrated as a reliable technique for the thermal assessment of pulsed-operated HEMTs. Thermal modelling and time-resolved micro-Raman thermography were used for the determination of thermoreflectance coefficients of the metal contacts under study. The need of the extraction of the thermoreflectance coefficient value for each metal present at the device was demonstrated.

KW - HEMT

KW - GaN

KW - self-heating

KW - transient thermoreflectance

KW - time-resolved Raman

KW - thermal modelling

M3 - Conference Contribution (Conference Proceeding)

SP - 283

EP - 286

BT - CS MANTECH 2016

PB - CS Mantech

T2 - 31st Annual International Conference on Compound Semiconductor Manufacturing Technology, CS ManTech 2016

Y2 - 16 May 2016 through 19 May 2016

ER -

Transient thermoreflectance for device temperature assessment in pulsed-operated GaN-based HEMTs

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Conference

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Keywords

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