Transmission electron microscope radiation damage of 4H and 6H SiC studied by photoluminescence spectroscopy

JW Steeds, GA Evans, LR Danks, S Furkert, W Voegeli, MM Ismail, F Carosella

Research output: Contribution to journalArticle (Academic Journal)peer-review

63 Citations (Scopus)
Translated title of the contributionTransmission electron microscope radiation damage of 4H and 6H SiC studied by photoluminescence spectroscopy
Original languageEnglish
Pages (from-to)1923 - 1945
Number of pages23
JournalDiamond and Related Materials
Volume11 (12)
DOIs
Publication statusPublished - Dec 2002

Bibliographical note

Publisher: Elsevier

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