Triple Pulse Test (TPT) for Characterizing Power Loss in Magnetic Components in Analogous to Double Pulse Test (DPT) for Power Electronics Devices

Jun Wang, Xibo Yuan*, Navid Rasekh

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

Original languageEnglish
Title of host publicationIEEE IECON 2020 - 46th Annual Conference of the IEEE Industrial Electronics Society
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Publication statusAccepted/In press - 15 Jul 2020

Cite this

Wang, J., Yuan, X., & Rasekh, N. (Accepted/In press). Triple Pulse Test (TPT) for Characterizing Power Loss in Magnetic Components in Analogous to Double Pulse Test (DPT) for Power Electronics Devices. In IEEE IECON 2020 - 46th Annual Conference of the IEEE Industrial Electronics Society Institute of Electrical and Electronics Engineers (IEEE).