UIS performance and ruggedness of stand-alone and cascode SiC JFETs

Research output: Contribution to journal › Article (Academic Journal) › peer-review

Original language	English
Journal	Microelectronics Reliability
DOIs	https://doi.org/10.1016/j.microrel.2020.113803
Publication status	Published - Nov 2020

Access to Document

TY - JOUR

T1 - UIS performance and ruggedness of stand-alone and cascode SiC JFETs

AU - Jahdi, Saeed

PY - 2020/11

Y1 - 2020/11

UR - http://dx.doi.org/10.1016/j.microrel.2020.113803

U2 - 10.1016/j.microrel.2020.113803

DO - 10.1016/j.microrel.2020.113803

M3 - Article (Academic Journal)

JO - Microelectronics Reliability

JF - Microelectronics Reliability

SN - 0026-2714

ER -