Ultrasonic wave-based defect localization using probabilistic modeling

M. D. Todd*, E. B. Flynn, P. D. Wilcox, B. W. Drinkwater, A. J. Croxford, S. Kessler

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

1 Citation (Scopus)

Abstract

This work presents a new approach rooted in maximum likelihood estimation for defect localization in sparse array guided wave ultrasonic interrogation applications. The approach constructs a minimally-informed statistical model of the guided wave process, where unknown or uncertain model parameters are assigned non-informative Bayesian prior distributions and integrated out of the a posteriori probability calculation. The premise of this localization approach is straightforward: the most likely defect location is the point on the structure with the maximum a posteriori probability of actually being the location of damage (i.e., the most probable location given a set of sensor measurements). The proposed approach is tested on a complex stiffened panel against other common localization approaches and found to have superior performance in all cases.

Original languageEnglish
Title of host publicationAIP Conference Proceedings
Pages639-646
Number of pages8
Volume1430
Edition31
DOIs
Publication statusPublished - 13 Jul 2012
Event38th Annual Review of Progress in Quantitative Nondestructive Evaluation (QNDE 2011) - Burlington, VT, United States
Duration: 17 Jul 201122 Jul 2011
Conference number: 38

Conference

Conference38th Annual Review of Progress in Quantitative Nondestructive Evaluation (QNDE 2011)
Abbreviated titleQNDE 2011
CountryUnited States
CityBurlington, VT
Period17/07/1122/07/11

Keywords

  • Bayesian Modeling
  • Sparse Array Localization
  • Ultrasonic Guided Waves

Fingerprint Dive into the research topics of 'Ultrasonic wave-based defect localization using probabilistic modeling'. Together they form a unique fingerprint.

  • Cite this

    Todd, M. D., Flynn, E. B., Wilcox, P. D., Drinkwater, B. W., Croxford, A. J., & Kessler, S. (2012). Ultrasonic wave-based defect localization using probabilistic modeling. In AIP Conference Proceedings (31 ed., Vol. 1430, pp. 639-646) https://doi.org/10.1063/1.4716287