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Ultrasonic wave-based defect localization using probabilistic modeling
M. D. Todd*, E. B. Flynn, P. D. Wilcox, B. W. Drinkwater, A. J. Croxford, S. Kessler
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)
5
Citations
(Scopus)