Unravelling Nonlinear Spectral Evolution Using Nanoscale Photonic Near-Field Point-to-Point Measurements

Matthias Wulf*, Daryl M. Beggs, Nir Rotenberg, L. Kuipers

*Corresponding author for this work

Research output: Contribution to journalArticle (Academic Journal)peer-review

8 Citations (Scopus)

Abstract

We demonstrate nanoscale photonic point-to-point measurements characterizing a single component inside an all-optical signal-processing chip. We perform spectrally resolved near-field scanning optical microscopy on ultrashort pulses propagating inside a slow light photonic crystal waveguide, which is part of a composite sample. A power study reveals a reshaping of the pulse's spectral density, which we model using the nonlinear Schrodinger equation. With the model, we are able to identify the various physical processes governing the nonlinear pulse propagation. Finally, we contrast the near-field measurements with transmission measurements of the complete composite sample to elucidate the importance of gaining local information about the evolution of the spectral density.

Original languageEnglish
Pages (from-to)5858-5865
Number of pages8
JournalNano Letters
Volume13
Issue number12
DOIs
Publication statusPublished - Dec 2013

Keywords

  • Near-field spectroscopy
  • integrated nanophotonics
  • nonlinear optics
  • slow light
  • photonic crystal
  • CRYSTAL WAVE-GUIDES
  • SELF-PHASE-MODULATION
  • SCANNING OPTICAL MICROSCOPY
  • SLOW-LIGHT
  • SILICON CHIP
  • PULSES
  • ENHANCEMENT
  • ABSORPTION
  • GENERATION
  • SPACE

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