Unusual Deformation and Fracture in Gallium Telluride Multilayers

Yan Zhou, Shi Zhou, Penghua Ying, Qinghua Zhao, Yong Xie*, Mingming Gong, Pisu Jiang, Hui Cai, Bin Chen, Sefaattin Tongay, Jin Zhang*, Wanqi Jie, Tao Wang*, Pingheng Tan, Dong Liu, Martin Kuball*

*Corresponding author for this work

Research output: Contribution to journalArticle (Academic Journal)peer-review

9 Citations (Scopus)

Abstract

The deformation and fracture mechanism of two-dimensional (2D) materials are still unclear and not thoroughly investigated. Given this, mechanical properties and mechanisms are explored on example of gallium telluride (GaTe), a promising 2D semiconductor with an ultrahigh photoresponsivity and a high flexibility. Hereby, the mechanical properties of both substrate-supported and suspended GaTe multilayers were investigated through Berkovich-tip nanoindentation instead of the commonly used AFM-based nanoindentation method. An unusual concurrence of multiple pop-in and load-drop events in loading curve was observed. Theoretical calculations unveiled this concurrence originating from the interlayer-sliding mediated layers-by-layers fracture mechanism in GaTe multilayers. The van der Waals force dominated interlayer interactions between GaTe and substrates was revealed much stronger than that between GaTe interlayers, resulting in the easy sliding and fracture of multilayers within GaTe. This work introduces new insights into the deformation and fracture of GaTe and other 2D materials in flexible electronics applications.
Original languageEnglish
Pages (from-to)3831-3839
Number of pages9
JournalJournal of Physical Chemistry Letters
Volume13
Issue number17
DOIs
Publication statusPublished - 25 Apr 2022

Bibliographical note

This work was in part supported by the Engineering and
Physical Sciences Research Council (EPSRC) under EP/
P013562/1. D.L. acknowledges support from EPSRC Fellowship
(EP/N004493/2) and New Investigator Award (EP/T000368/1). T.W. acknowledges support by the Shenzhen Virtual University Park under Grant 2021Szvup110. Y.X. acknowledges support from the National Natural Science Foundation of China under Grants 61704129 and 6201101295, and the Key Research and Development Program of Shaanxi (Program No.2021KW-02). S.T. acknowledges support from National Science Foundation under Grants DMR 1904716, DMR 1552220, and DMR 1933214 and the Department of Energy under Grant DOE-SC0020653. The authors are grateful to Filip Gucmann (School of Physics, University of Bristol) in helping some measurements of film thickness and morphology using atomic force microscopy.

Research Groups and Themes

  • CDTR

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