Use of Energy-filtered PhotoElectron Emission Microscopy and Kelvin Probe Force Microscopy to visualise work function changes on diamond thin films terminated with oxygen and lithium mono-layers for thermionic energy conversion

Hugo Dominguez Andrade; M Z Othman; Kane M O'Donnell; Josh H Lay; Paul W May; Neil A Fox; J Morin; O Renault

doi:10.1504/IJNT.2014.063789

Use of Energy-filtered PhotoElectron Emission Microscopy and Kelvin Probe Force Microscopy to visualise work function changes on diamond thin films terminated with oxygen and lithium mono-layers for thermionic energy conversion

Hugo Dominguez Andrade, M Z Othman, Kane M O'Donnell, Josh H Lay, Paul W May, Neil A Fox, J Morin, O Renault

Research output: Contribution to journal › Article (Academic Journal) › peer-review

5 Citations (Scopus)

Original language	English
Pages (from-to)	796-807
Journal	International Journal of Nanotechnology
Volume	11
DOIs	https://doi.org/10.1504/IJNT.2014.063789
Publication status	Published - 2014

Keywords

CVD diamond
Lithium
kelvin probe

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10.1504/IJNT.2014.063789

http://www.chm.bristol.ac.uk/pt/diamond/pdf/ijnt11-796.pdf

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Professor Neil A Fox
- Neil.Foxbristol.acuk
- School of Chemistry - Professor of Materials for Energy
- Cabot Institute for the Environment
- Soft Matter, Colloids and Materials
- Materials for Energy
Person: Academic , Member

Cite this

Dominguez Andrade, H., Othman, M. Z., O'Donnell, K. M., Lay, J. H., May, P. W., Fox, N. A., Morin, J., & Renault, O. (2014). Use of Energy-filtered PhotoElectron Emission Microscopy and Kelvin Probe Force Microscopy to visualise work function changes on diamond thin films terminated with oxygen and lithium mono-layers for thermionic energy conversion. International Journal of Nanotechnology, 11, 796-807. https://doi.org/10.1504/IJNT.2014.063789

@article{5567903e3ce141dcb1bad828a33668dd,

title = "Use of Energy-filtered PhotoElectron Emission Microscopy and Kelvin Probe Force Microscopy to visualise work function changes on diamond thin films terminated with oxygen and lithium mono-layers for thermionic energy conversion",

keywords = "CVD diamond, Lithium, kelvin probe",

author = "{Dominguez Andrade}, Hugo and Othman, {M Z} and O'Donnell, {Kane M} and Lay, {Josh H} and May, {Paul W} and Fox, {Neil A} and J Morin and O Renault",

year = "2014",

doi = "10.1504/IJNT.2014.063789",

language = "English",

volume = "11",

pages = "796--807",

journal = "International Journal of Nanotechnology",

}

Dominguez Andrade, H, Othman, MZ, O'Donnell, KM, Lay, JH, May, PW , Fox, NA, Morin, J & Renault, O 2014, 'Use of Energy-filtered PhotoElectron Emission Microscopy and Kelvin Probe Force Microscopy to visualise work function changes on diamond thin films terminated with oxygen and lithium mono-layers for thermionic energy conversion', International Journal of Nanotechnology, vol. 11, pp. 796-807. https://doi.org/10.1504/IJNT.2014.063789

Use of Energy-filtered PhotoElectron Emission Microscopy and Kelvin Probe Force Microscopy to visualise work function changes on diamond thin films terminated with oxygen and lithium mono-layers for thermionic energy conversion. / Dominguez Andrade, Hugo; Othman, M Z; O'Donnell, Kane M et al.
In: International Journal of Nanotechnology, Vol. 11, 2014, p. 796-807.

Research output: Contribution to journal › Article (Academic Journal) › peer-review

TY - JOUR

T1 - Use of Energy-filtered PhotoElectron Emission Microscopy and Kelvin Probe Force Microscopy to visualise work function changes on diamond thin films terminated with oxygen and lithium mono-layers for thermionic energy conversion

AU - Dominguez Andrade, Hugo

AU - Othman, M Z

AU - O'Donnell, Kane M

AU - Lay, Josh H

AU - May, Paul W

AU - Fox, Neil A

AU - Morin, J

AU - Renault, O

PY - 2014

Y1 - 2014

KW - CVD diamond

KW - Lithium

KW - kelvin probe

U2 - 10.1504/IJNT.2014.063789

DO - 10.1504/IJNT.2014.063789

M3 - Article (Academic Journal)

VL - 11

SP - 796

EP - 807

JO - International Journal of Nanotechnology

JF - International Journal of Nanotechnology

ER -

Dominguez Andrade H, Othman MZ, O'Donnell KM, Lay JH, May PW , Fox NA et al. Use of Energy-filtered PhotoElectron Emission Microscopy and Kelvin Probe Force Microscopy to visualise work function changes on diamond thin films terminated with oxygen and lithium mono-layers for thermionic energy conversion. International Journal of Nanotechnology. 2014;11:796-807. doi: 10.1504/IJNT.2014.063789

Use of Energy-filtered PhotoElectron Emission Microscopy and Kelvin Probe Force Microscopy to visualise work function changes on diamond thin films terminated with oxygen and lithium mono-layers for thermionic energy conversion

Keywords

Access to Document

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Profiles

Professor Neil A Fox

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