Using memristor state change behavior to identify faults in photovoltaic arrays

Jimson Mathew^*, Marco Ottavi, Yunfan Yang, Dhiraj K. Pradhan

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

5 Citations (Scopus)

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Yield and reliability enhancement techniques for novel memory devices
Pradhan, D. K. (Principal Investigator)
24/08/12 → 24/12/15
Project: Research