Vacancy Type Defects after Post Growth Quenching and Re-Annealing of SI GaAs

JM Clayton, HM Fretwell, SG Usmar, MA Alam, DTJ Hurle

Research output: Contribution to journalArticle (Academic Journal)peer-review

Translated title of the contributionVacancy Type Defects after Post Growth Quenching and Re-Annealing of SI GaAs
Original languageEnglish
Pages (from-to)929 - 932
Number of pages3
JournalMat Sci Forum
Volume105-10
Publication statusPublished - 1992

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