Translated title of the contribution | Variation-Aware TED- Based Approach for Nano-CMOS RTL Leakage Optimization |
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Original language | English |
Title of host publication | IEEE 24th International Conference on VLSI Design |
Publication status | Published - Jan 2011 |
Variation-Aware TED- Based Approach for Nano-CMOS RTL Leakage Optimization
S. Banerjee, J. Matthew, DK Pradhan, S. P. Mohanty
Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)
3
Citations
(Scopus)