| Translated title of the contribution | Wafer surface reconstruction from scaning electron microscopy images using RNN |
|---|---|
| Original language | English |
| Title of host publication | International Symposium on Computers and Information Sciences (ISCIS), Antalya, Turkey |
| Publication status | Published - Oct 2001 |
Wafer surface reconstruction from scaning electron microscopy images using RNN
T Kocak, E Gelenbe
Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)