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Low-frequency, baseband effects in Power Amplifiers can become particularly important when steps are taken to improve operational efficiency through the application of `envelope' based approaches such as Envelope Elimination and Restoration (EER) and Envelope Tracking (ET). The aim of this paper is to demonstrate how a broadband modulated time-domain measurement system, when used in combination with active IF load-pull, can be employed to gain valuable insight into the behaviour of high-frequency power transistors whilst operating under modulated conditions. Also considered is the interesting idea of how PA linearity can be improved using the very mechanisms that are employed to improve efficiency.
|Translated title of the contribution||Waveform engineering applied to linear-efficient PA design|
|Title of host publication||IEEE 11th Annual Wireless and Microwave Technology Conference 2010 (WAMICON), Melbourne, FL|
|Publisher||Institute of Electrical and Electronics Engineers (IEEE)|
|Pages||1 - 5|
|Number of pages||5|
|Publication status||Published - Apr 2010|
|Event||11th Annual Wireless and Microwave Technology Conference (WAMICON) - Melbourne, FL, United States|
Duration: 1 Apr 2010 → …
|Conference||11th Annual Wireless and Microwave Technology Conference (WAMICON)|
|Period||1/04/10 → …|
Bibliographical noteRose publication type: Conference contribution
Sponsorship: This work has been carried out as part of EPSRC grant EP1F033702/I. The authors would also like to thank CREE for supporting this activity and supplying the devices; specifically Ray Pengelly, Dr. Chris Harris and Mr. Simon Wood.
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- amplifier distortion
- amplifier linearity
- amplifier efficiency
- power amplifier
Lees, J., Akmal, M., Ben Smida, S., Woodington, S., Cripps, S., Benedikt, J., Morris, KA., Beach, MA., McGeehan, JP., & Tasker, P. (2010). Waveform engineering applied to linear-efficient PA design. In IEEE 11th Annual Wireless and Microwave Technology Conference 2010 (WAMICON), Melbourne, FL (pp. 1 - 5). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/WAMICON.2010.5461847