What is the ultimate precision of CBED structure factor measurements?  Application to Group IV and III-V semiconductors

M Saunders, PA Midgley, R Vincent

Research output: Contribution to journal › Article (Academic Journal) › peer-review

Translated title of the contribution	What is the ultimate precision of CBED structure factor measurements? Application to Group IV and III-V semiconductors
Original language	English
Pages (from-to)	144 - 145
Journal	Proceedings: Microscopy and Microanalysis
Volume	1995
Publication status	Published - 1995

Handle.net

@article{23abf6a69ed841868441f94eff1ae71a,

title = "What is the ultimate precision of CBED structure factor measurements? Application to Group IV and III-V semiconductors",

author = "M Saunders and PA Midgley and R Vincent",

year = "1995",

language = "English",

volume = "1995",

pages = "144 -- 145",

journal = "Proceedings: Microscopy and Microanalysis",

issn = "1083-0375",

publisher = "Cambridge University Press",

}

TY - JOUR

T1 - What is the ultimate precision of CBED structure factor measurements? Application to Group IV and III-V semiconductors

AU - Saunders, M

AU - Midgley, PA

AU - Vincent, R

PY - 1995

Y1 - 1995

M3 - Article (Academic Journal)

SN - 1083-0375

VL - 1995

SP - 144

EP - 145

JO - Proceedings: Microscopy and Microanalysis

JF - Proceedings: Microscopy and Microanalysis

ER -