Research Outputs
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Search results
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Thermal Profiles Within the Channel of Planar Gunn Diodes Using Micro-Particle Sensors
Glover, J., Khalid, A., Cumming, D., Dunn, G. M., Kuball, M., Montes Bajo, M. & Oxley, C. H., 1 Sept 2017, In: IEEE Electron Device Letters. 38, 9, p. 1325-1327 3 p., 7993046.Research output: Contribution to journal › Article (Academic Journal) › peer-review
4 Citations (Scopus) -
“Leaky Dielectric” Model for the Suppression of Dynamic RON in Carbon Doped AlGaN/GaN HEMTs
Uren, M., Karboyan, S., Chatterjee, I., Pooth, A., Moens, P., Banerjee, A. & Kuball, M., Jul 2017, In: IEEE Transactions on Electron Devices. 64, 7, p. 2826-2834 9 p.Research output: Contribution to journal › Article (Academic Journal) › peer-review
Open AccessFile216 Citations (Scopus)613 Downloads (Pure) -
(Invited) Diamond - the Unknowns and Challenges to Make It Work for GaN Electronics
Kuball, M., Anaya, J., Liu, D., Baranyai, R., Sun, H. & Pomeroy, J. W., 2016, p. 1212. 1 p.Research output: Contribution to conference › Conference Abstract › peer-review
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(Invited) intrinsic reliability assessment of 650V rated AlGaN/GaN based power devices: an industry perspective
Moens, P., Banerjee, A., Constant, A., Coppens, P., Caesar, M., Li, Z., Vanderweghe, S., Declercq, F., Padmanabhan, B., Jeon, W., Guo, J., Salih, A., Tack, M., Meneghini, M., Dalcanale, S., Tajilli, A., Meneghesso, G., Zanoni, E., Uren, M. & Chatterjee, I. & 2 others, , 19 May 2016, 229th ECS Meeting May 29, 2016 - June 2, 2016 San Diego, CA: Silicon Compatible Materials, Processes, and Technologies for Advanced Integrated Circuits and Emerging Applications 6. Roozeboom, F., Narayanan, V., Kakushima, K., Timans, P. J., Gusev, E. P., Karim, Z. & De Gendt, S. (eds.). The Electrochemical Society, Inc, p. 65-76 12 p. (ECS Transactions; vol. 72, no. 4).Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)
Open AccessFile24 Citations (Scopus)662 Downloads (Pure) -
A Review of Raman Thermography for Electronic and Opto-Electronic Device Measurement With Submicron Spatial and Nanosecond Temporal Resolution
Kuball, M. H. H. & Pomeroy, J. W., 2 Dec 2016, In: IEEE Transactions on Device and Materials Reliability. 16, 4, p. 667-684 18 p.Research output: Contribution to journal › Article (Academic Journal) › peer-review
Open AccessFile112 Citations (Scopus)1367 Downloads (Pure) -
Back bias ramping and photoionization spectroscopy analysis of GaN-on-Si HFETs
Pooth, A., Martin, T., Uren, M. J. & Kuball, M., 2016, CS MANTECH 2016 - International Conference on Compound Semiconductor Manufacturing Technology. CS Mantech, p. 73-75 3 p.Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)
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Control of the in-plane thermal conductivity of ultra-thin nanocrystalline diamond films through the grain and grain boundary properties
Anaya Calvo, J., Rossi, S., Alomari, M., Kohn, E., Tóth, L., Pécz, B., Hobart, K. D., Anderson, T. J., Feygelson, T. I., Pate, B. B. & Kuball, M. H. H., 15 Jan 2016, In: Acta Materialia. 103, p. 141-152 11 p.Research output: Contribution to journal › Article (Academic Journal) › peer-review
Open AccessFile113 Citations (Scopus)713 Downloads (Pure) -
Disturbed and scattered: The Path of thermal conduction through diamond lattice
Faili, F., Huang, W., Calvo, J., Kuball, M. & Twitchen, D., 20 Jul 2016, (E-pub ahead of print) 2016 15th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm). Institute of Electrical and Electronics Engineers (IEEE), p. 1133-1138 6 p. 7517675. (IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm)).Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)
7 Citations (Scopus) -
Dynamic-Ron in Small and Large C-doped AlGaN/GaN-on-Si HEMTs
Karboyan, S., Uren, M. J., Martin Horcajo, S., Pomeroy, J. W., Chatterjee, I., Moens, P., Banerjee, A., Caesar, M. & Kuball, M., 17 May 2016, CS MANTECH 2016: International Conference on Compound Semiconductor Manufacturing Technology. CS Mantech, p. 211-214 4 p.Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)
Open AccessFile8 Citations (Scopus)362 Downloads (Pure) -
Effect of grain size of polycrystalline diamond on its heat spreading properties
Simon, R. B., Anaya, J., Faili, F., Balmer, R., Williams, G. T., Twitchen, D. J. & Kuball, M. H. H., 1 Jun 2016, In: Applied Physics Express. 9, 6, 4 p., 061302.Research output: Contribution to journal › Article (Academic Journal) › peer-review
Open AccessFile43 Citations (Scopus)425 Downloads (Pure) -
Floating body effects in carbon doped GaN HEMTs
Kuball, M. H. H., Uren, M. J., Pooth, A., Karboyan, S., Waller, W. & Chatterjee, I., Feb 2016, 2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA 2015) : Proceedings of a meeting held 2-4 November 2015, Blacksburg, Virginia, USA. Institute of Electrical and Electronics Engineers (IEEE), p. 70-74 5 p. 7369271Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)
Open AccessFile3 Citations (Scopus)464 Downloads (Pure) -
GaN-on-diamond: Robust mechanical and thermal properties
Sun, H., Liu, D., Pomeroy, J. W., Francis, D., Faili, F., Twitchen, D. J. & Kuball, M., 27 May 2016, CS MANTECH 2016: International Conference on Compound Semiconductor Manufacturing Technology. CS Mantech, p. 201-203 3 p.Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)
Open AccessFile6 Citations (Scopus)162 Downloads (Pure) -
Impact of buffer charge on the reliability of carbon doped AlGaN/GaN-on-Si HEMTs
Chatterjee, I., Uren, M. J., Pooth, A., Karboyan, S., Martin-Horcajo, S., Kuball, M., Lee, K. B., Zaidi, Z., Houston, P. A., Wallis, D. J., Guiney, I. & Humphreys, C. J., Oct 2016, 2016 IEEE International Reliability Physics Symposium (IRPS 2016): Proceedings of a meeting held 17-21 April 2016, Pasadena, California, USA. Institute of Electrical and Electronics Engineers (IEEE), p. 4A41-4A45 7574529. (Proceedings of the IEEE International Reliability Physics Symposium (IRPS)).Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)
Open AccessFile5 Citations (Scopus)596 Downloads (Pure) -
Impact of buffer leakage on intrinsic reliability of 650V AlGaN/GaN HEMTs
Moens, P., Banerjee, A., Uren, M., Meneghini, M., Karboyan, S., Chatterjee, I., Vanmeerbeek, P., Caesar, M., Liu, C., Salih, A., Zanoni, E., Meneghesso, G., Kuball, M. & Tack, M., Mar 2016, 2015 IEEE International Electron Devices Meeting (IEDM 2015): Proceedings of a meeting held 7-9 December 2015, Washington, DC, USA. Institute of Electrical and Electronics Engineers (IEEE), p. 35.2.1-35.2.4 4 p.Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)
Open AccessFile75 Citations (Scopus)783 Downloads (Pure) -
Mechanism of hot electron electroluminescence in GaN-based transistors
Brazzini, T., Sun, H., Sarti, F., Pomeroy, J. W., Hodges, C. J., Gurioli, M., Vinattieri, A., Uren, M. & Kuball, M. H. H., 2 Nov 2016, In: Journal of Physics D: Applied Physics. 49, 43, 6 p., 435101.Research output: Contribution to journal › Article (Academic Journal) › peer-review
Open AccessFile24 Citations (Scopus)326 Downloads (Pure) -
Reverse-biased induced mechanical stress in AlGaN/GaN power diodes
Power, M., Pomeroy, J. W., Chatterjee, I., Risbud, D. M., Wynne, B., Gajda, M. A., Sonsky, J., Pedrotti, K. D., Uren, M. J. & Kuball, M., 25 Jul 2016, Proceedings of the International Symposium on Power Semiconductor Devices and ICs. Institute of Electrical and Electronics Engineers (IEEE), Vol. 2016-July. p. 103-106 4 p. 7520788Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)
4 Citations (Scopus) -
Simultaneous measurement of optical and RF behavior under CW and pulsed Fully Active Harmonic Load-Pull
Casbon, M. A., Brazzini, T., Tasker, P. J., Uren, M. J. & Kuball, M. H. H., Aug 2016, 2016 87th ARFTG Microwave Measurement Conference (ARFTG 2016): Proceedings of a meeting held 27 May 2016, San Francisco, California, USA. Institute of Electrical and Electronics Engineers (IEEE), 4 p. 7501954Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)
Open AccessFile1 Citation (Scopus)296 Downloads (Pure) -
Subthreshold Mobility in AlGaN/GaN HEMTs
Waller, W., Kuball, M., Uren, M., Lee, K. B., Houston, P. A., Wallis, D. J., Guiney, I., Humphreys, C. J., Pandey, S. & Šonský, J., May 2016, In: IEEE Transactions on Electron Devices. 63, 5, p. 1861-1865 4 p.Research output: Contribution to journal › Article (Academic Journal) › peer-review
Open AccessFile6 Citations (Scopus)528 Downloads (Pure) -
Temperature-Dependent Thermal Resistance of GaN-on-Diamond HEMT Wafers
Sun, H., Pomeroy, J., Baranyai, R., Francis, D., Faili, F., Twitchen, D. J. & Kuball, M., 22 Apr 2016, In: IEEE Electron Device Letters. 37, 5, p. 621-624 4 p.Research output: Contribution to journal › Article (Academic Journal) › peer-review
Open AccessFile63 Citations (Scopus)522 Downloads (Pure) -
The effects of grain size and grain boundary characteristics on the thermal conductivity of nanocrystalline diamond
Spiteri, D., Anaya Calvo, J. & Kuball, M., 28 Feb 2016, In: Journal of Applied Physics. 119, 8, 7 p., 085102.Research output: Contribution to journal › Article (Academic Journal) › peer-review
32 Citations (Scopus) -
Thermal Management of GaN Electronics
Pomeroy, J. & Kuball, M., 2016, (Unpublished).Research output: Contribution to conference › Conference Abstract › peer-review
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Thermal management of GaN-on-diamond high electron mobility transistors: Effect of the nanostructure in the diamond near nucleation region
Anaya, J., Sun, H., Pomeroy, J. & Kuball, M., 20 Jul 2016, (E-pub ahead of print) 2016 15th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm). Institute of Electrical and Electronics Engineers (IEEE), p. 1558-1565 8 p. 7517734Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)
30 Citations (Scopus) -
Transient thermoreflectance for device temperature assessment in pulsed-operated GaN-based HEMTs
Martin Horcajo, S., Pomeroy, J. W., Lambert, B., Jung, H., Blanck, H. & Kuball, M., 17 May 2016, CS MANTECH 2016: International Conference on Compound Semiconductor Manufacturing Technology. CS Mantech, p. 283-286 4 p.Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)
Open AccessFile3 Citations (Scopus)175 Downloads (Pure) -
Transient Thermoreflectance for Gate Temperature Assessment in Pulse Operated GaN-based HEMTs
Martin Horcajo, S., Pomeroy, J., Lambert, B., Jung, H., Blanck, H. & Kuball, M., 27 Jul 2016, In: IEEE Electron Device Letters. 37, 9, p. 1197-1200 4 p.Research output: Contribution to journal › Letter (Academic Journal) › peer-review
Open AccessFile34 Citations (Scopus)534 Downloads (Pure) -
Charge movement in a GaN-based hetero-structure field effect transistor structure with carbon doped buffer under applied substrate bias
Pooth, A., Uren, M. J., Caesar, M., Martin, T. & Kuball, M. H. H., 7 Dec 2015, In: Journal of Applied Physics. 118, 21, 4 p., 215701.Research output: Contribution to journal › Article (Academic Journal) › peer-review
Open AccessFile32 Citations (Scopus)534 Downloads (Pure)