Skip to content

Absolute pose estimation using multiple forms of correspondences from RGB-D frames

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication2016 IEEE International Conference on Robotics and Automation (ICRA 2016)
Subtitle of host publicationProceedings of a meeting held 16-21 May 2016, Stockholm, Sweden
Publisher or commissioning bodyInstitute of Electrical and Electronics Engineers (IEEE)
Pages4756-4761
Number of pages6
ISBN (Electronic)9781467380263
ISBN (Print)9781467380270
DOIs
DateAccepted/In press - 14 Jan 2016
DateE-pub ahead of print - 16 May 2016
DatePublished (current) - Aug 2016
Event2016 IEEE International Conference on Robotics and Automation (ICRA) - Stockholm, Sweden
Duration: 16 May 201621 May 2016

Conference

Conference2016 IEEE International Conference on Robotics and Automation (ICRA)
CountrySweden
CityStockholm
Period16/05/1621/05/16

Abstract

We describe a new approach to absolute pose estimation from noisy and outlier contaminated matching point sets for RGB-D sensors. We show that by integrating multiple forms of correspondence based on 2-D and 3-D points and surface normals gives more precise, accurate and robust pose estimates. This is because it gives more constraints than using one form alone and increases the available measurements, especially when dealing with sparse matching sets. We demonstrate the approach by incorporating it within a RANSAC algorithm and introduce a novel direct least-square approach to calculate pose estimates. Results from experiments on synthetic and real data demonstrate improved performance over existing methods.

    Research areas

  • computer vision, robotics, pose estimation, SLAM

Event

2016 IEEE International Conference on Robotics and Automation (ICRA)

Duration16 May 201621 May 2016
CityStockholm
CountrySweden
Degree of recognitionInternational event

Event: Conference

Download statistics

No data available

Documents

Documents

  • Full-text PDF (accepted author manuscript)

    Rights statement: This is the author accepted manuscript (AAM). The final published version (version of record) is available online via IEEE at http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7487678. Please refer to any applicable terms of use of the publisher.

    Accepted author manuscript, 706 KB, PDF-document

DOI

View research connections

Related faculties, schools or groups