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An On-Chip Homodyne Detector for Measuring Quantum States

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication2018 IEEE Photonics Society Summer Topicals Meeting Series (SUM 2018)
Publisher or commissioning bodyInstitute of Electrical and Electronics Engineers (IEEE)
Pages139-140
Number of pages2
ISBN (Electronic)9781538653432
ISBN (Print)9781538653449
DOIs
DateAccepted/In press - 8 Jul 2018
DateE-pub ahead of print (current) - 5 Sep 2018
Event2018 IEEE Photonics Society Summer Topicals Meeting Series, SUM 2018 - Waikoloa, United States
Duration: 9 Jul 201811 Jul 2018

Publication series

Name
ISSN (Print)2376-8614

Conference

Conference2018 IEEE Photonics Society Summer Topicals Meeting Series, SUM 2018
CountryUnited States
CityWaikoloa
Period9/07/1811/07/18

Abstract

We present the first silicon-integrated homodyne detector suitable for characterising quantum states of light travelling in a silicon waveguide. We report high-fidelity quantum state tomography of coherent states. The device was also used to generate random numbers at a speed of 1.2 Gbps.

    Research areas

  • integrated optics, quantum measurements, quantum optics, silicon photonics

Event

2018 IEEE Photonics Society Summer Topicals Meeting Series, SUM 2018

Duration9 Jul 201811 Jul 2018
CityWaikoloa
CountryUnited States

Event: Conference

Documents

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